Experimentally investigating the performance degradations of the CMOS PA at different temperatures

Abstract

To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temperature changes. The main reasons for these degradations are discussed and analyzed in this paper. The research performed in the study provides another angle to handle the practical working environments rather than the extreme cases as the reliability study.