Photonics (Apr 2017)

Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2

  • Eléonore Roussel,
  • Enrico Allaria,
  • Carlo Callegari,
  • Marcello Coreno,
  • Riccardo Cucini,
  • Simone Di Mitri,
  • Bruno Diviacco,
  • Eugenio Ferrari,
  • Paola Finetti,
  • David Gauthier,
  • Giuseppe Penco,
  • Lorenzo Raimondi,
  • Cristian Svetina,
  • Marco Zangrando,
  • Andreas Beckmann,
  • Leif Glaser,
  • Gregor Hartmann,
  • Frank Scholz,
  • Joern Seltmann,
  • Ivan Shevchuk,
  • Jens Viefhaus,
  • Luca Giannessi

DOI
https://doi.org/10.3390/photonics4020029
Journal volume & issue
Vol. 4, no. 2
p. 29

Abstract

Read online

The control of polarization state in soft and hard X-ray light is of crucial interest to probe structural and symmetry properties of matter. Thanks to their Apple-II type undulators, the FERMI-Free Electron Lasers are able to provide elliptical, circular or linearly polarized light within the extreme ultraviolet and soft X-ray range. In this paper, we report the characterization of the polarization state of FERMI FEL-2 down to 5 nm. The results show a high degree of polarization of the FEL pulses, typically above 95%. The campaign of measurements was performed at the Low Density Matter beamline using an electron Time-Of-Flight based polarimeter.

Keywords