Journal of Agricultural Science and Sustainable Production (Jan 2017)
The Effect of Various Input Intensities on Yield and Yield Components of Common Bean Varieties
Abstract
In order to examine the effects ofdifferent intensities of input on seed yield and yield components of bean varieties an experiment was conducted as split plot based on randomized complete block design with three replications in National Bean Research Station at Khomeyn. Treatments were different intensities of inputs; including ecological, integrated, low-input, medium-input and high-input comprising the main-treatments and different bean varieties (navy bean cv. Dorsa, kidney bean cv.Ks-31169 and pinto bean cv. Sadri) as sub-treatments. Different inputs intensities included frequency of tillage operations and various amounts of fertilizer, pesticides, seeds and irrigation. High-input and ecological systems had the least and the highest tillage operations with 2 and 7 tillages, respectively. Nutrients in low-, medium- and high-input were supplied by chemical fertilizer, in ecological system by manure and in combination of manure and chemical fertilizer. Control of pest and weed in high-input were conducted by chemical methods, in integrated, low- and medium-input system by combination of chemical and physical methods and in ecological system by physical method. The greatest quantity of stem length and diameter, and seed number was observed in high-input of navy bean, while the greatest pod number and length, and seed length obtained in integrated production system of navy bean. The highest diameter of pod and seed, biological yield and harvest index, however, was observed in integrated production system of pinto bean and the highest seed weight obtained in high-input production system. Integrated production system of pinto bean had 53% higher biological yield, 26% higher harvest index and integrated production system of navy bean had 53% higher seed weight over the low-input production system of navy bean. This result suggest that bean production under integrated systems addition to acceptable yield save application of inputs.
