New buffer layer materials RESbO3 (RE = Y, Sm, Dy, and Ho), Gd1−xCaxBiO3, Gd1−xPbxBiO3, and Eu1−xCaxBiO3 for coated conductors were deposited on a single crystal LaAlO3 substrate through the self-developed polymer-assisted chemical solution deposition method, and YSbO3 was also deposited on CeO2/NiW. Then, the results of x-ray diffraction patterns and SEM indicate high c-axis oriented, smooth, compact, and seamless properties of fabricated new buffer layers, which satisfied the subsequent growth of the superconducting layer. This work offers an effective method to prepare new buffer layers for coated conductors and may provide a new way to search materials with minimal mismatched lattice.
