50th anniversary and recent decade achievements of the Hokkaido University Neutron Source (HUNS) facility with cold-fast neutrons and high-energy electrons/X-rays

Abstract

In this paper, present status, scientific strategy, recent decade achievements and future perspectives of HUNS with cold, thermal, epithermal, fast neutrons and high-energy electrons/X-rays are presented. Time-of-flight small-angle cold neutron scattering with SAXS is useful for extended-duration materials and foods analysis. Irradiations using fast neutrons, thermal neutrons, 32 MeV electrons and MeV-class X-rays are used for not only soft error test of system-level semiconductor devices but also astrophysics and medical biology. Time-of-flight neutron imaging can accept big sample, system-level sample and many samples for crystalline microstructure and temperature analyses in steel, car and cultural heritage research fields. The reasons of such great activities are discussed.