Fabrication of Multilayer Cu/Ni Systems with Nanometric Layers by Electrolysis Method

Abstract

The paper presents research results of multilayer systems composed of alternate Cu/Ni layers. The layers thickness obtained by the galvanic treatment was determined by using the transmission electron microscopy and X-ray diffraction method in the grazing incidence diffraction geometry. The surface morphology was observed using scanning electron microscope with EDS microanalysis. Observation of the surface topography of systems using the atomic force microscope was also carried out.

Keywords

• cu/ni multilayer systems
• galvanic method
• thickness measurement
• surface morphology and topography