PLoS ONE (Jan 2021)

A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy.

  • Chandra Macauley,
  • Martina Heller,
  • Alexander Rausch,
  • Frank Kümmel,
  • Peter Felfer

DOI
https://doi.org/10.1371/journal.pone.0245555
Journal volume & issue
Vol. 16, no. 1
p. e0245555

Abstract

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Atom probe tomography (APT) is a powerful technique to obtain 3D chemical and structural information, however the 'standard' atom probe experimental workflow involves transfer of specimens at ambient conditions. The ability to transfer air- or thermally-sensitive samples between instruments while maintaining environmental control is critical to prevent chemical or morphological changes prior to analysis for a variety of interesting sample materials. In this article, we describe a versatile transfer system that enables cryogenic- or room-temperature transfer of specimens in vacuum or atmospheric conditions between sample preparation stations, a focused ion beam system (Zeiss Crossbeam 540) and a widely used commercial atom probe system (CAMECA LEAP 4000X HR). As an example for the use of this transfer system, we present atom probe data of gallium- (Ga)-free grain boundaries in an aluminum (Al) alloy specimen prepared with a Ga-based FIB.