Advances in Electrical and Computer Engineering (May 2016)

Quantitative Analysis of Memristance Defined Exponential Model for Multi-bits Titanium Dioxide Memristor Memory Cell

  • DAOUD, A. A. D.,
  • DESSOUKI, A. A. S.,
  • ABUELENIN, S. M.

DOI
https://doi.org/10.4316/aece.2016.02011
Journal volume & issue
Vol. 16, no. 2
pp. 75 – 84

Abstract

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The ability to store multiple bits in a single memristor based memory cell is a key feature for high-capacity memory packages. Studying multi-bit memristor circuits requires high accuracy in modelling the memristance change. A memristor model based on a novel definition of memristance is proposed. A design of a single memristor memory cell using the proposed model for the platinum electrodes titanium dioxide memristor is illustrated. A specific voltage pulse is used with varying its parameters (amplitude or pulse width) to store different number of states in a single memristor. New state variation parameters associated with the utilized model are provided and their effects on write and read processes of memristive multi-states are analysed. PSPICE simulations are also held, and they show a good agreement with the data obtained from the analysis.

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