Journal of the Egyptian Mathematical Society (Oct 2015)

Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization

  • R.U. Khan,
  • A. Kulshrestha,
  • M.A. Khan

DOI
https://doi.org/10.1016/j.joems.2014.11.003
Journal volume & issue
Vol. 23, no. 3
pp. 558 – 562

Abstract

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In this note we give some recurrence relations satisfied by single and product moments of k-th upper record values from the exponential-Weibull lifetime distribution. Using a recurrence relation for single moments we obtain a characterization of exponential-Weibull, Weibull, exponential, Rayleigh and two parameter linear failure rate distributions.

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