Journal of the Egyptian Mathematical Society (Oct 2015)
Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization
Abstract
In this note we give some recurrence relations satisfied by single and product moments of k-th upper record values from the exponential-Weibull lifetime distribution. Using a recurrence relation for single moments we obtain a characterization of exponential-Weibull, Weibull, exponential, Rayleigh and two parameter linear failure rate distributions.
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