A Systematical Characterization of TeO₂–V₂O₅ Glass System Using Boron (III) Oxide and Neodymium (III) Oxide Substitution: Resistance Behaviors against Ionizing Radiation

Abstract

This study aimed to perform an extensive characterization of a 74.75TeO2–0.25V2O5–(25 − x)B2O3-xNd2O3 glass system with (x = 0, 0.5, 1.0, and 1.5 mol%) for radiation shielding properties. Linear and mass attenuation coefficients were determined using Phy-X PSD software and compared with the simulation using Monte Carlo software MCNPX (version 2.7.0). Half value layer, mean free path, tenth value layer, effective atomic number, exposure buildup factor, and energy absorption buildup factors of VTBNd0.0, VTBNd0.5, VTBNd1.0, and VTBNd1.5 glasses were determined, respectively. The results showed that boron (III) oxide and neodymium (III) oxide substitution has an obvious impact on the gamma ray attenuation properties of the studied glasses. It can be concluded that the VTBNd1.5 sample with the highest content of neodymium (III) oxide (1.5 mol%) is the superior sample for shielding of gamma radiation in the investigated energy range.

Keywords

• MCNPX
• neodymium (III) oxide
• ionizing radiation
• Phy-X PSD