Increase of noise immunity of photomask images binarization in the space of the wavelet transform

Abstract

An information technology for histogram analysis and a method for noise immunity binary processing of integrated and printed circuits board photo-masks image based on this technology was carryed out. This method based on the sub-gradient iterative noise stability optimization method satisfies the demands of the automated optical control of photo-masks and printed circuits in the error and noise immunity. The maximum binary processing error does not exceed 1 pixel if the signal-to-noise ratio is more than 7.

Keywords

• binarization
• wavelet-transform
• subgradient
• noise immunity