IET Science, Measurement & Technology (Oct 2024)

Predicting the coupling of HPEM waveform with a power amplifier in perforated conductive enclosure using FDDM/VF

  • Ali Kalantarnia,
  • Abdollah Mirzabeigi

DOI
https://doi.org/10.1049/smt2.12189
Journal volume & issue
Vol. 18, no. 8
pp. 429 – 442

Abstract

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Abstract One of the most common methods to protect electronic and telecommunication systems in a high‐power electromagnetic (HPEM) environment is using a conductive enclosure. Amplifiers are the vital parts in transmitter and receiver systems as the main components of a telecommunication system, so investigating the effects of HPEM waveform on their performance is very important. The Presence of apertures in the body of the conductive enclosure, as well as non‐linear elements such as transistors in amplifiers, adds to the complexity of examining the coupling of electromagnetic fields on the performance of amplifiers. Considering the importance of the topic, in this study, the impact of the HPEM waveform on the power amplifier inside the conductive enclosure has been investigated. By using the finite difference delay modelling (FDDM) numerical method as a stable method followed by the vector fitting (VF) method, the electromagnetic problem has become a circuit problem, which allows examining the response of the power amplifier and any circuit, including non‐linear elements against the interference field. Responses of bipolar linear and non‐linear components in the perforated conductive enclosure by the proposed method have been compared with the results obtained by computer simulation technology microwave studio (CST‐MWS) for verification.

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