Beilstein Journal of Nanotechnology (Dec 2014)

Advanced atomic force microscopy techniques II

  • Thilo Glatzel,
  • Ricardo Garcia,
  • Thomas Schimmel

DOI
https://doi.org/10.3762/bjnano.5.241
Journal volume & issue
Vol. 5, no. 1
pp. 2326 – 2327

Abstract

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