Path Loss Modeling of RFID Backscatter Channels With Reconfigurable Intelligent Surface: Experimental Validation

Abstract

In the realm of radio frequency identification (RFID) technology, the integration of reconfigurable intelligent surfaces (RISs) has opened up new possibilities for real-time remote data capturing and seamless connectivity. By manipulating the electromagnetic properties of the environment, RIS enables the control of electromagnetic wave propagation and allows for virtual line-of-sight (LOS) in cases where physical LOS is blocked. This has tremendous implications for the future of RFID applications, particularly with the emergence of chipless RFID technology. In this regard, this paper develops free-space path loss models for RIS-assisted RFID wireless communications. The proposed models in this study have taken into account several crucial physical factors, including tag radar cross-section (RCS), the physical properties of the RIS, and the radiative near-field/far-field effects of the RIS. To further validate the theoretical findings, we have conducted experimental measurements using a fabricated RIS. Numerical simulations were also utilized to validate the models and verify our findings. The channel measurements have demonstrated good agreement with the proposed path loss models, further bolstering the potential of RIS-assisted RFID wireless communications.

Keywords

• Path loss models
• chipless RFID
• RIS
• experimental measurements