Nanoscale Research Letters (Apr 2017)

Engineering the Complex-Valued Constitutive Parameters of Metamaterials for Perfect Absorption

  • Pengwei Wang,
  • Naibo Chen,
  • Chaojun Tang,
  • Jing Chen,
  • Fanxin Liu,
  • Saiqian Sheng,
  • Bo Yan,
  • Chenghua Sui

DOI
https://doi.org/10.1186/s11671-017-2048-2
Journal volume & issue
Vol. 12, no. 1
pp. 1 – 6

Abstract

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Abstract We theoretically studied how to directly engineer the constitutive parameters of metamaterials for perfect absorbers of electromagnetic waves. As an example, we numerically investigated the necessary refractive index n and extinction coefficient k and the relative permittivity ε and permeability μ of a metamaterial anti-reflection layer, which could cancel the reflection from a hydrogenated amorphous silicon (α-Si:H) thin film on a metal substrate, within the visible wavelength range from 300 to 800 nm. We found that the metamaterial anti-reflection layer should have a negative refractive index (n 0) for long-wavelength visible light. The relative permittivity ε and permeability μ could be fitted by the Lorentz model, which exhibited electric and magnetic resonances, respectively.

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