Active and Passive Electronic Components (Jan 1989)

Study of Thick Film Resistors By 1/f Noise Measurements

A. Ambrózy,
E. Hahn,
L. B. Kiss,
G. Trefán

Affiliations

A. Ambrózy: Technical University, Budapest H-1521, Hungary
E. Hahn: Technical University, Budapest H-1521, Hungary
L. B. Kiss: JATE University, Szeged H-6720, Hungary
G. Trefán: JATE University, Szeged H-6720, Hungary

DOI: https://doi.org/10.1155/1989/36201
Journal volume & issue: Vol. 13, no. 3
pp. 191 – 195

Abstract

Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.

Published in Active and Passive Electronic Components

ISSN: 0882-7516 (Print); 1563-5031 (Online)
Publisher: Hindawi Limited
Country of publisher: United Kingdom
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://onlinelibrary.wiley.com/journal/5080

About the journal