Microdetector system for speedy X-ray studies

Abstract

Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.

Keywords

• X-rays diffraction
• position sensitive detectors
• transient phase transformations
• temperature dependence of phase transformations in metals
• microstrip silicon detectors