High temperature study on the thermal properties of few-layer Mo0.5W0.5S2 and effects of capping layers

Hong Gu; Youming Lu; Deliang Zhu; Kuilong Li; Shunan Zheng; Jianfeng Wang; Kah-Wee Ang; Ke Xu; Xinke Liu

Results in Physics (Jan 2017)

High temperature study on the thermal properties of few-layer Mo0.5W0.5S2 and effects of capping layers

Hong Gu,
Youming Lu,
Deliang Zhu,
Kuilong Li,
Shunan Zheng,
Jianfeng Wang,
Kah-Wee Ang,
Ke Xu,
Xinke Liu

Affiliations

Hong Gu: College of Materials Science and Engineering, Guangdong Research Center for Interfacial Engineering of Functional Materials, Shenzhen Key Laboratory of Special Functional Materials, Chinese Engineering and Research Institute of Microelectronics, Shenzhen University, Shenzhen 518060, PR China; Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, PR China
Youming Lu: College of Materials Science and Engineering, Guangdong Research Center for Interfacial Engineering of Functional Materials, Shenzhen Key Laboratory of Special Functional Materials, Chinese Engineering and Research Institute of Microelectronics, Shenzhen University, Shenzhen 518060, PR China
Deliang Zhu: College of Materials Science and Engineering, Guangdong Research Center for Interfacial Engineering of Functional Materials, Shenzhen Key Laboratory of Special Functional Materials, Chinese Engineering and Research Institute of Microelectronics, Shenzhen University, Shenzhen 518060, PR China
Kuilong Li: College of Materials Science and Engineering, Guangdong Research Center for Interfacial Engineering of Functional Materials, Shenzhen Key Laboratory of Special Functional Materials, Chinese Engineering and Research Institute of Microelectronics, Shenzhen University, Shenzhen 518060, PR China
Shunan Zheng: Suzhou Institute of Nano-tech and Nano-bionics, CAS, Suzhou 215123, PR China
Jianfeng Wang: Suzhou Institute of Nano-tech and Nano-bionics, CAS, Suzhou 215123, PR China
Kah-Wee Ang: National University of Singapore, Engineering Drive 3, 117583, Singapore
Ke Xu: Suzhou Institute of Nano-tech and Nano-bionics, CAS, Suzhou 215123, PR China; Corresponding authors.
Xinke Liu: College of Materials Science and Engineering, Guangdong Research Center for Interfacial Engineering of Functional Materials, Shenzhen Key Laboratory of Special Functional Materials, Chinese Engineering and Research Institute of Microelectronics, Shenzhen University, Shenzhen 518060, PR China; Corresponding authors.

Journal volume & issue: Vol. 7
pp. 4394 – 4397

Abstract

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We investigated the thermal properties of few-layer Mo0.5W0.5S2 using a series of samples with different kinds of capping layers. Temperature-dependent Raman measurements were conducted in the range of 300–500 K, with power-dependent measurements also carried out. It indicated, for the few-layer Mo0.5W0.5S2, the temperature coefficients of the WS2-like E12g mode, MoS2-like E12g mode and A1g mode were −0.0155 cm−1/K, −0.0146 cm−1/K, and −0.0130 cm−1/K, respectively. And the thermal conductivity was estimated to be 44.8 W/mK. Moreover, the Mo0.5W0.5S2 samples coated with capping layers (ZrO2, HfO2) both showed a better thermal stability and a larger thermal conductivity than the one without. The results revealed that the capping layer should be an important factor in the thermal property. Keywords: Mo0.5W0.5S2, TMDs, Thermal properties, High temperature, Capping layers, Raman

Published in Results in Physics

ISSN: 2211-3797 (Online)
Publisher: Elsevier
Country of publisher: Netherlands
LCC subjects: Science: Physics
Website: http://www.journals.elsevier.com/results-in-physics/

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