E3S Web of Conferences (Jan 2019)

The Compensation Mothed for Temperature Rise Test of 750kV Magnetic Controllable Reactor

  • Zhang Xiaodong,
  • Lv Bo,
  • Qu Tong,
  • Zhang Haiting,
  • Ma Yunfei,
  • Ma Xiaoting

DOI
https://doi.org/10.1051/e3sconf/201911802062
Journal volume & issue
Vol. 118
p. 02062

Abstract

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The article introduces the principle of Magnetic Controllable Reactor(MCR) in power system applications, the temperature 1rise test is the important type test in the factory, but it will lead to errors of the temperature rise test results in the factory because the test conditions in the factory is different from the actual operation circuit. In this paper, a compensation method for temperature rise test is introduced, which can make up for the shortcomings of temperature rise test in factory, and the results of simulation by PSCAD and measurement show that the method presented in this pape is effective.