Electronics Letters (Mar 2024)
Mechanical dicing of optical quality facets and waveguides in a silicon nitride platform
Abstract
Abstract The authors report a ductile dicing process for manufacturing optical‐quality facets in a multi‐layered silicon nitride platform without the need for polishing. A surface roughness (Sa) of 1.5 nm was achieved. This technique was extended to fabricate ridge waveguides, and the results and characterization are reported.
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