Active and Passive Electronic Components (Jan 1977)

Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors

  • M. Prudenziati,
  • F. Forlani,
  • M. Cocito,
  • A. Cattaneo

DOI
https://doi.org/10.1155/APEC.4.205
Journal volume & issue
Vol. 4, no. 3-4
pp. 205 – 211

Abstract

Read online

No abstracts available.