IEEE Photonics Journal (Jan 2013)

TE/TM-Pass Polarizer Based on Lithium Niobate on Insulator Ridge Waveguide

  • Emi Saitoh,
  • Yuki Kawaguchi,
  • Kunimasa Saitoh,
  • Masanori Koshiba

DOI
https://doi.org/10.1109/JPHOT.2013.2250938
Journal volume & issue
Vol. 5, no. 2
pp. 6600610 – 6600610

Abstract

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We propose a TE/TM-pass polarizer based on a shallow X-cut lithium niobate-on-insulator (LNOI) ridge waveguide. In shallow X-cut LNOI ridge waveguides, the leaky mode is interchanged between TE and TM polarization waves depending on the ridge waveguide height. The phenomenon does not occur in silicon-on-insulator ridge waveguides. We use this special loss mechanism for TE/TM-pass polarizers. We evaluate structural and wavelength dependencies of polarizers by a vectorial finite-element method. The extinction ratios of 108 dB/mm and 27 dB/mm are obtained for TE-pass and TM-pass polarizers.

Keywords