Electronics Letters (Nov 2024)

Statistical resolution analysis of microwave computational imaging

  • Jinyu Zhang,
  • Taiyang Hu,
  • Mengxuan Xiao,
  • Haoxuan Zhang,
  • Li Wu,
  • Zelong Xiao

DOI
https://doi.org/10.1049/ell2.70078
Journal volume & issue
Vol. 60, no. 21
pp. n/a – n/a

Abstract

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Abstract This letter presents a model based on the Cramér–Rao bound theory for calculating the theoretical lower limit of imaging resolution of microwave computational imaging aided by re‐configurable metasurface. The model takes into account two crucial parameters: the signal‐to‐noise ratio and the number of measurements in the imaging process. By simultaneously considering the signal‐to‐noise ratio and the number of measurements, as well as other parameters, the model allows for a comprehensive assessment of the imaging resolution of the imaging system. In addition, both position estimation and intensity estimation are considered, and a new composite statistical resolution concept is proposed, which is more suitable for microwave computational imaging.

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