The Astrophysical Journal Supplement Series (Jan 2024)

S-PLUS: Photometric Recalibration with the Stellar Color Regression Method and an Improved Gaia XP Synthetic Photometry Method

  • Kai Xiao,
  • Yang Huang,
  • Haibo Yuan,
  • Timothy C. Beers,
  • Bowen Huang,
  • Shuai Xu,
  • Lin Yang,
  • Felipe Almeida-Fernandes,
  • Hélio D. Perottoni,
  • Guilherme Limberg,
  • William Schoenell,
  • Tiago Ribeiro,
  • Antonio Kanaan,
  • Natanael Gomes de Oliveira

DOI
https://doi.org/10.3847/1538-4365/ad24fa
Journal volume & issue
Vol. 271, no. 2
p. 41

Abstract

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We present a comprehensive recalibration of narrowband/medium-band and broadband photometry from the Southern Photometric Local Universe Survey (S-PLUS) by leveraging two approaches: an improved Gaia XP synthetic photometry (XPSP) method with corrected Gaia XP spectra, and the stellar color regression (SCR) method with corrected Gaia Early Data Release 3 photometric data and spectroscopic data from LAMOST Data Release 7. Through the use of millions of stars as standards per band, we demonstrate the existence of position-dependent systematic errors, up to 23 mmag for the main survey region, in the S-PLUS iDR4 photometric data. A comparison between the XPSP and SCR methods reveals minor differences in zero-point offsets, typically within the range of 1–6 mmag, indicating the accuracy of the recalibration, and a twofold to threefold improvement in the zero-point precision. During this process, we also verify and correct for systematic errors related to CCD position. The corrected S-PLUS iDR4 photometric data will provide a solid data foundation for conducting scientific research that relies on high-precision calibration. Our results underscore the power of the XPSP method in combination with the SCR method, showcasing their effectiveness in enhancing calibration precision for wide-field surveys when combined with Gaia photometry and XP spectra, to be applied for other S-PLUS subsurveys.

Keywords