Measurement Science Review (Jan 2010)

Measurement of nanopatterned surfaces by real and reciprocal space techniques

  • Siffalovic P.,
  • Vegso K.,
  • Jergel M.,
  • Majkova E.,
  • Keckes J.,
  • Maier G.,
  • Cornejo M.,
  • Ziberi B.,
  • Frost F.,
  • Hasse B.,
  • Wiesmann J.

DOI
https://doi.org/10.2478/v10048-010-0027-1
Journal volume & issue
Vol. 10, no. 5
pp. 153 – 156

Abstract

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