Performance improvement of single- and multi-frequency direct sampling methods in microwave imaging

Abstract

Recently, it turned out that application of multiple frequency direct sampling method (DSM) does not guarantee a good result in microwave imaging. Here we propose and numerically demonstrate alternative single- and multi-frequency indicator functions of DSM for improving the imaging efficiency of small anomaly. The simulation results with synthetic data show that the imaging performance of suggested methods is better than that of traditional approaches.

Keywords

• Direct sampling method
• Scattering parameters
• Microwave imaging
• Simulation results