Sample-Control-Device of Smart Substation

Abstract

At present, smart substations adopt process-level equipment of "intelligent terminals and merging units". In this way, the merging unit cannot meet the basic requirement of "the damage of a single component inside the device cannot cause the protection to malfunction". In the process layer, messages between equipment are mostly in one-frame mode. Once the message is abnormal, it will often cause the protection to malfunction. In order to improve the reliability of relay protection, a new generation device architecture with complete dual is proposed. Key technologies such as voltage seamless selection technology, time-delay measurable switching technology, process layer networking and Lagrange interpolation are proposed.

Keywords

• smart substation
• high reliability
• control device
• delay measurable