Shock and impact reliability of electronic assemblies with perimeter vs full array layouts: A numerical comparative study

Abstract

This study aims to assess the effect of the solder joint array layouts, including full and peripheral designs, on the mechanical response and reliability of electronic packages subjected to shock and impact loadings. Linear and nonlinear finite element simulations using the global-local modeling technique are employed to perform the analysis. Several peripheral array configurations are considered and compared to the full array systems. The results showed that, for optimum electronic package designs in terms of reliability and cost, it is highly recommended to use peripheral packages having three or four rows of solder interconnects in electronic systems under shock and impact loadings.

Keywords

• electronic packaging
• reliability
• peripheral and full arrays
• shock and impact