Complex & Intelligent Systems (Oct 2023)

LGP-YOLO: an efficient convolutional neural network for surface defect detection of light guide plate

  • Yan Wan,
  • Junfeng Li

DOI
https://doi.org/10.1007/s40747-023-01256-4
Journal volume & issue
Vol. 10, no. 2
pp. 2083 – 2105

Abstract

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Abstract Light guide plate (LGP) is a key component of liquid crystal display (LCD) display systems, so its quality directly affects the display effect of LCD. However, LGPs have complex background texture, low contrast, varying defect size and numerous defect types, which makes realizing efficient and accuracy-satisfactory surface defect automatic detection of LGPS still a big challenge. Therefore, combining its optical properties, dot distribution, defect imaging characteristics and detection requirements, a surface defect detection algorithm based on LGP-YOLO for practical industrial applications is proposed in this paper. To enhance the feature extraction ability of the network without dimensionality reduction, expand the effective receptive field and reduce the interference of invalid targets, we built the receptive field module (RFM) by combining the effective channel attention network (ECA-Net) and reviewing large kernel design in CNNs (RepLKNet). For the purpose of optimizing the performance of the network in downstream tasks, enhance the network's expression ability and improve the network’s ability of detecting multi-scale targets, we construct the small detection module (SDM) by combining space-to-depth non-strided convolution (SPDConv) and omini-dimensional dynamic convolution (ODConv). Finally, an LGP defect dataset is constructed using a set of images collected from industrial sites, and a multi-round experiment is carried out to test the proposed method on the LGP detect dataset. The experimental results show that the proposed LGP-YOLO network can achieve high performance, with mAP and F1-score reaching 99.08% and 97.45% respectively, and inference speed reaching 81.15 FPS. This demonstrates that LGP-YOLO can strike a good balance between detection accuracy and inference speed, capable of meeting the requirements of high-precision and high-efficiency LGP defect detection in LGP manufacturing factories.

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