Modification of tube-based X-ray fluorescence spectrometer with an Am-241 excitation-based attachment for rare-earth elements analysis

Abstract

This study presents a significant enhancement to the analytical capabilities of an existing X-ray fluorescence (XRF) spectrometer by integrating an Am-241 excitation-based system. The modification enables precise and cost-effective analysis of rare-earth elements (REEs), expanding the spectrometer’s utility. Successful identification and quantification of Scandium (8.1 ± 1.3 mg\kg), Ytterium (7.9 ± 2.0 mg\kg), Lanthanum (27.5 ± 2.1 mg\kg), Cerium (60.4 ± 2.5 mg\kg), Neodymium (29.7 ± 1.2 mg\kg), Samarium (4.6 ± 2.0 mg\kg), Europium (0.8 ± 0.4 mg\kg), Gadolinium (2.6 ± 0.6 mg\kg), and Erbium (3.5 ± 1.2 mg\kg) were achieved using their K-X-rays. The quantitative analysis employed the "Elemental Sensitivities Method" and was validated against established methods like Instrumental Neutron Activation Analysis (INAA) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS). The modified system demonstrated an accuracy of approximately 80% in analyzing REEs in the IAEA-Soil 7 reference material.

Keywords

• Rare-earth elements
• instrumental neutron activation analysis
• Am-241 excitation-based system
• X-ray fluorescence
• tube excitation-based system
• Ian Phillip Jones, University of Birmingham, United Kingdom of Great Britain and Northern Ireland