A novel method for determining the resistivity of compressed superconducting materials

Abstract

The measurement of resistivity in a compressed material within a diamond anvil cell presents significant challenges. The high-pressure experimental setup makes it difficult to directly measure the size changes induced by pressure in the three crystallographic directions of the sample. In this study, we introduce a novel and effective method that addresses these technical challenges. This method is anticipated to offer a valuable foundation for high-pressure investigations on quantum materials, particularly those with anisotropic layered structures.