Structure of Oxidized and Unoxidized Surfaces of InTe Layered Crystals

Abstract

Topology and structure of oxidized and unoxidized surfaces of InTe layered crystal were investigated using atomic force microscopy and X-ray phase analysis. The maximum deviation of inhomogeneity of unoxidized surface of InTe does not exceed 2 nm demonstrating its high quality. It is shown that annealing of InTe crystal in air at 400 ºС and 650 ºC affects the surface topology differently. It is also established that oxidation at 650 ºС results in formation of two chemical phases in the near-surface region: In2O3 and In2Te3 of the cubic structure.

Keywords

• Layered crystal
• InTe
• Nanostructures
• Oxide
• Atomic-force microscop