Determining the optimal variant of built in test equipment at electronic system

Abstract

Problem of determining the optimal variant of built-in test equipment (BITE) in an electronic system, from an integral logistic support aspect, is considered. The developed methodology is based on: the generation of identified relevant variants of BITE, the preparation of input parameters, the optimisation of spare parts for all BITE variants, the calculation of identified criteria and the choice of the best variant. The optimization criteria are operational availability and o part of costs in the life cycle. The procedure of determining the optimal variant of BITE is illustrated through one hypothetical electronic device.

Keywords

• electronic system
• built-in test equipment
• corrective maintenance
• operational availability
• life cycle costs
• optimization
• optimal variant of built-in test equipment