Rapid non-destructive inspection of sub-surface defects in 3D printed alumina through 30 layers with 7 μm depth resolution
C. Lapre,
D. Brouczek,
M. Schwentenwein,
K. Neumann,
N. Benson,
C.R. Petersen,
O. Bang,
N.M. Israelsen
Affiliations
C. Lapre
DTU Electro, Department of Electrical and Photonics Engineering, Technical University of Denmark, Ørsteds Plads 343, Kgs. Lyngby, 2800, Denmark; Corresponding author.
D. Brouczek
Lithoz GmbH, Mollardgasse 85a/2/64-69, Vienna, 1060, Austria
M. Schwentenwein
Lithoz GmbH, Mollardgasse 85a/2/64-69, Vienna, 1060, Austria
DTU Electro, Department of Electrical and Photonics Engineering, Technical University of Denmark, Ørsteds Plads 343, Kgs. Lyngby, 2800, Denmark; NORBLIS ApS, Virumgade 35D, Virum, 2830, Denmark
O. Bang
DTU Electro, Department of Electrical and Photonics Engineering, Technical University of Denmark, Ørsteds Plads 343, Kgs. Lyngby, 2800, Denmark; NORBLIS ApS, Virumgade 35D, Virum, 2830, Denmark; NKT Photonics A/S, Blokken 84, Birkerød, 3460, Denmark
N.M. Israelsen
DTU Electro, Department of Electrical and Photonics Engineering, Technical University of Denmark, Ørsteds Plads 343, Kgs. Lyngby, 2800, Denmark; NORBLIS ApS, Virumgade 35D, Virum, 2830, Denmark
The use of additive manufacturing (AM) processes has grown rapidly over the last ten years like fused deposition modelling and stereolithography techniques. 3D printing offers advantages in ceramic component production due to its flexibility. To enhance quality and reduce resource consumption in ceramics industry, fast, integrated, sub-surface and non-destructive inspection (NDI) with high resolution is needed. This study demonstrates sub-surface monitoring of 3D printed alumina parts to a depth of ∼0.7 mm in images of 400 × 2048 pixels with a lateral resolution of 30 μm and axial resolution of 7 μm, using mid-infrared optical coherence tomography (MIR OCT) based on a 4 μm center wavelength MIR supercontinuum laser. We detected individual printed ceramic layers and tracked predefined defects through all four processing steps and demonstrated how a defect in the green phase could affect the final product. This research sets the stage for NDI integration in AM.