Applied Sciences (Nov 2021)

A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser

  • Bocheng Ding,
  • Weiqing Xu,
  • Ruichang Wu,
  • Yunfei Feng,
  • Lifang Tian,
  • Xiaohong Li,
  • Jianye Huang,
  • Zhi Liu,
  • Xiaojing Liu

DOI
https://doi.org/10.3390/app112110272
Journal volume & issue
Vol. 11, no. 21
p. 10272

Abstract

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Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kinetic energy to 1 keV. Here, we report on a recently built composite VMI spectrometer at the Shanghai soft X-ray free-electron laser, which can measure ion images and high-energy electron images simultaneously. In the SIMION simulation, we extended the electron kinetic energy to 1 keV with a resolution O+ kinetic energy spectrum from dissociative ionization of O2 by 800 nm femtosecond laser. We reached a resolution of 1.5% at the electron kinetic energy of 500 eV. When the electron arm is set for 100 eV, a resolution of 4% is reached at the ion kinetic energy of 5.6 eV. This composite VMI spectrometer will support the experiment, such as X-ray multi-photon excitation/ionization, Auger electrons emission, attosecond streaking.

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