IEEE Open Journal of Industry Applications (Jan 2024)

Desat Protection With Ultrafast Response for High-Voltage SiC MOSFETs With High <italic>dv&#x002F;dt</italic>

  • Xingxuan Huang,
  • Dingrui Li,
  • Min Lin,
  • Leon M. Tolbert,
  • Fred Wang,
  • William Giewont

DOI
https://doi.org/10.1109/OJIA.2024.3353309
Journal volume & issue
Vol. 5
pp. 94 – 105

Abstract

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This article presents a desat protection scheme with the ultrafast response for high-voltage (>3.3 kV) SiC MOSFETs. Its working principle is the same as the conventional desat protection designed for high-voltage SiC MOSFETs, yet its blanking time is implemented by fully considering the influence of high negative dvds/dt during the fast turn-on transient. With the same circuitry as the conventional desat protection, the proposed protection scheme can significantly shorten the response time of the desat protection when it is used to protect high-voltage SiC MOSFETs. In addition, the proposed protection scheme with ultrafast response features strong noise immunity, low-cost, and simple implementation. By taking advantage of the high dv/dt during the normal turn-on transients, the proposed protection scheme can be even faster when the MOSFET has a faster switching speed. Design details and the response speed analysis under various short circuit faults are presented in detail. A half bridge phase leg based on discrete 10 kV/20 A SiC MOSFETs is built to demonstrate the proposed protection scheme. Experimental results at 6.5 kV validate the ultrafast response (115 ns response time under a hard switching fault, 155 ns response time under a fault under load), and strong noise immunity of the proposed desat protection scheme.

Keywords