High Temperature Materials and Processes (Aug 2000)

Recording of Elevated Temperature Fatigue Crack Growth Data by DCPD System

  • Ramachandran, N.,
  • Arakere, N.,
  • Goswami, T.

DOI
https://doi.org/10.1515/HTMP.2000.19.5.357
Journal volume & issue
Vol. 19, no. 5
pp. 357 – 370

Abstract

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