Vector MO magnetometry for mapping microwave currents

Abstract

Magneto-optic (MO) effects in magnetic multilayers (MML) can be employed in non-invasive 2D mapping of microwave (mw) radiation on the surface of semiconductor chips. A typical sensor configuration consists of Fe nanolayers sandwiched with dielectrics on a thin Si substrate transparent to mw radiation. To extend the observation bandwidth, Δf, up to 100 GHz range the sensor works at ferromagnetic resonance (FMR) frequency in applied magnetic flux density, Bappl. The mw currents excite the precession of magnetization, M, in magnetic nanolayers proportional to their amplitude. The MO component reflected on the sensor surface is proportional to the amplitude of M component, M⊥. The laser source operates at the wavelength of 410 nm. Its plane of incidence is oriented perpendicular to the M⊥ plane. M⊥ oscillates between polar and transverse configurations. A substantial improvement of MO figure of merit takes place in aperiodic MML. More favorable Δf vs. Bappl dependence and MO response can potentially be achieved in MML imbedding hexagonal ferrite or Co nanolayers with in-plane magnetic anisotropy.