Piezoresponse force microscopy and nanoferroic phenomena

Alexei Gruverman; Marin Alexe; Dennis Meier

doi:10.1038/s41467-019-09650-8

Nature Communications (Apr 2019)

Piezoresponse force microscopy and nanoferroic phenomena

Alexei Gruverman,
Marin Alexe,
Dennis Meier

Affiliations

Alexei Gruverman: Department of Physics and Astronomy, University of Nebraska
Marin Alexe: Department of Physics, University of Warwick
Dennis Meier: Department of Materials Science and Engineering, Norwegian University of Science and Technology (NTNU)

DOI: https://doi.org/10.1038/s41467-019-09650-8
Journal volume & issue: Vol. 10, no. 1
pp. 1 – 9

Abstract

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Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

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