An efficient method for faults diagnosis in analog circuits based on machine learning classifiers

Abstract

The presented paper introduces an accurate approach for detecting and classifying parametric or soft faults that affect analog integrated circuits. This technique is based on the use of machine learning algorithm to improve the accuracy and the performance of fault classification process. To achieve this, the real and imaginary frequency responses of output voltage and supply current of the circuits under test (CUT) are used to extract features for both normal and faulty cases. These features are then exploited to train machine learning classifiers, from which the selected one among its equivalents is the quadratic discriminant classifier since it allowed the highest average accuracy score. The faults to be investigated are parametric ones affecting resistors and capacitors values. The proposed approach is validated using three filters circuits that are Sallen-Key band-pass filter, four op-amp biquad high-pass filter, and a leapfrog filter circuit. Obtained results indicate a high classification average accuracy for all circuits that are undergone testing. The proposed approach has provided a highest classification accuracy level comparing to other research works.

Keywords

• Analog integrated circuits
• Parametric faults
• Fault detection
• Fault classification
• Machine learning