The Directory of Open Access Journals
DOAJ Logotype
Open
Global
Trusted
Main actions
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Search
Menu
Secondary actions
Search
Journals
Articles
Documentation
API
OAI-PMH
Widgets
Public data dump
OpenURL
XML
Metadata help
Preservation
About
About DOAJ
DOAJ at 20
DOAJ team
Ambassadors
Advisory Board & Council
Editorial Policy Advisory Group
Volunteers
News
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Login
Login
Quick search
Close
×
Journals
Articles
Search by keywords:
In the field:
In all fields
Title
ISSN
Subject
Publisher
Country of publisher
Search
Scientific Reports
(Aug 2024)
Author Correction: Insights into polycrystalline microstructure of blood films with 3D Mueller matrix imaging approach
Alexander G. Ushenko,
Anton Sdobnov,
Irina V. Soltys,
Yuriy A. Ushenko,
Alexander V. Dubolazov,
Valery M. Sklyarchuk,
Alexander V. Olar,
Liliya Trifonyuk,
Alexander Doronin,
Wenjun Yan,
Alexander Bykov,
Igor Meglinski
Affiliations
Alexander G. Ushenko
Taizhou Institute of Zhejiang University
Anton Sdobnov
Optoelectronics and Measurement Techniques, University of Oulu
Irina V. Soltys
Optics and Publishing Department, Yuriy Fedkovych Chernivtsi National University
Yuriy A. Ushenko
Department of Physics, Shaoxing University
Alexander V. Dubolazov
Optics and Publishing Department, Yuriy Fedkovych Chernivtsi National University
Valery M. Sklyarchuk
Optics and Publishing Department, Yuriy Fedkovych Chernivtsi National University
Alexander V. Olar
Optics and Publishing Department, Yuriy Fedkovych Chernivtsi National University
Liliya Trifonyuk
Rivne State Medical Center
Alexander Doronin
School of Engineering and Computer Science, Victoria University of Wellington
Wenjun Yan
Taizhou Institute of Zhejiang University
Alexander Bykov
Optoelectronics and Measurement Techniques, University of Oulu
Igor Meglinski
College of Engineering and Physical Sciences, Aston University
DOI
https://doi.org/10.1038/s41598-024-69469-2
Journal volume & issue
Vol. 14, no. 1
pp. 1 – 1
Abstract
Read online
No abstracts available.
WeChat QR code
Close