An X-ray Microscopy Study of the Microstructural Effects on Thermal Conductivity in Cast Aluminum-Copper Compounds

Abstract

A metallurgical joint between aluminum and copper established by compound casting provides for high thermal conductivity, which is required for lightweight cooling solutions in applications such as high-power light-emitting diodes or computer processors. If casting is employed in a silane-doped inert gas atmosphere whose oxygen partial pressure is adequate to extreme high vacuum, reoxidation of the active surfaces of aluminum and copper is prevented, and thus a metallurgical bond can be created directly between aluminum and copper. With this approach, thermal conductivities as high as 88.3 W/m·K were realized. In addition, X-ray microscopy was used to shed light on the microstructure–thermal property relationship. It is demonstrated that both porosity and non-bonded areas have a substantial impact on the thermophysical properties of the compound zone. Based on the data obtained, casting parameters can be developed that provide for defect-free bonding zones and optimal heat transfer between the joining partners.

Keywords

• aluminum-copper compounds
• compound casting
• silane
• microstructure
• thermal conductivity
• X-ray microscopy