E3S Web of Conferences (Jan 2023)

Verification methods for complex-functional blocks in CAD for chips deep submicron design standards

  • Zolnikov Vladimir,
  • Zolnikov Konstantin,
  • Ilina Nadezhda,
  • Grabovy Kirill

DOI
https://doi.org/10.1051/e3sconf/202337601090
Journal volume & issue
Vol. 376
p. 01090

Abstract

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The article discusses the design stages of very large-scale integrated circuits (VLSI) and the features of the procedure for verifying complex-functional VLSI blocks. The main approaches to microcircuit verification procedures are analyzed to minimize the duration of verification cycles. In practice, a combination of several approaches to verification is usually used.