Enhanced sum frequency generation for ultrasensitive characterization of plasmonic modes

Gao Min; He Yuhan; Chen Ying; Shih Tien-Mo; Yang Weimin; Chen Huanyang; Yang Zhilin; Wang Zhaohui

doi:10.1515/nanoph-2019-0447

Nanophotonics (Feb 2020)

Enhanced sum frequency generation for ultrasensitive characterization of plasmonic modes

Gao Min,
He Yuhan,
Chen Ying,
Shih Tien-Mo,
Yang Weimin,
Chen Huanyang,
Yang Zhilin,
Wang Zhaohui

Affiliations

Gao Min: Department of Physics, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Jiujiang Research Institute, Xiamen University, Xiamen 361005, China
He Yuhan: State Key Laboratory of Physical Chemistry of Solid Surfaces, The MOE Key Laboratory of Spectrochemical Analysis and Instrumentation, and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
Chen Ying: Institute of Electromagnetics and Acoustics and Key Laboratory of Electromagnetic Wave Science and Detection Technology, Xiamen University, Xiamen 361005, China
Shih Tien-Mo: Department of Mechanical Engineering, University of California, Berkeley, CA 94720, USA
Yang Weimin: Department of Physics, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Jiujiang Research Institute, Xiamen University, Xiamen 361005, China
Chen Huanyang: Institute of Electromagnetics and Acoustics and Key Laboratory of Electromagnetic Wave Science and Detection Technology, Xiamen University, Xiamen 361005, China
Yang Zhilin: Department of Physics, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Jiujiang Research Institute, Xiamen University, Xiamen 361005, China
Wang Zhaohui: State Key Laboratory of Physical Chemistry of Solid Surfaces, The MOE Key Laboratory of Spectrochemical Analysis and Instrumentation, and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China

DOI: https://doi.org/10.1515/nanoph-2019-0447
Journal volume & issue: Vol. 9, no. 4
pp. 815 – 822

Abstract

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Highly sensitive characterization of surface plasmon resonance (SPR) modes lays the solid foundation for wide SPR-related applications. Herein, we discover that these SPR modes based on all-metal nanostructures without any probed molecule can be characterized with ultrahigh sensitivities at both excitation and emission wavelengths by utilizing plasmon-enhanced sum frequency generation (PESFG) spectroscopy. The theory of PESFG for sensitively characterizing SPR modes is first validated experimentally. Moreover, we have elaborately demonstrated that PESFG strongly depends on both the resonant wavelengths of SPR modes and spatial mode distributions when azimuthal angles of excitations are varied. Our study not only enhances the understanding of the mechanism that governs PESFG, but also offers a potentially new method for exploring new-style SPR modes (e.g. plasmon-induced magnetic resonance and bound states in the continuum) by PESFG.

Published in Nanophotonics

ISSN: 2192-8606 (Print); 2192-8614 (Online)
Publisher: De Gruyter
Country of publisher: Germany
LCC subjects: Science: Physics
Website: https://www.degruyter.com/journal/key/nanoph/html#submit

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