Erratum: Hans, A.; Schmidt, P.; Ozga, C.; Hartmann, G.; Holzapfel, X.; Ehresmann, A.; Knie, A. Extreme Ultraviolet to Visible Dispersed Single Photon Detection for Highly Sensitive Sensing of Fundamental Processes in Diverse Samples. Materials 2018, 11, 869

Materials (Dec 2018)

Affiliations

Andreas Hans: Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Straße 40, 34305 Kassel, Germany
Philipp Schmidt: Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Straße 40, 34305 Kassel, Germany
Christian Ozga: Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Straße 40, 34305 Kassel, Germany
Gregor Hartmann: Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Straße 40, 34305 Kassel, Germany
Xaver Holzapfel: Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Straße 40, 34305 Kassel, Germany
Arno Ehresmann: Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Straße 40, 34305 Kassel, Germany
André Knie: Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Straße 40, 34305 Kassel, Germany

Abstract

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ISSN: 1996-1944 (Online)
Publisher: MDPI AG
Country of publisher: Switzerland
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering; Technology: Engineering (General). Civil engineering (General); Science: Natural history (General): Microscopy; Science: Physics: Descriptive and experimental mechanics
Website: http://www.mdpi.com/journal/materials/