The Directory of Open Access Journals
DOAJ Logotype
Open
Global
Trusted
Main actions
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Search
Menu
Secondary actions
Search
Journals
Articles
Documentation
API
OAI-PMH
Widgets
Public data dump
OpenURL
XML
Metadata help
Preservation
About
About DOAJ
DOAJ at 20
DOAJ team
Ambassadors
Advisory Board & Council
Editorial Policy Advisory Group
Volunteers
News
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Login
Login
Quick search
Close
×
Journals
Articles
Search by keywords:
In the field:
In all fields
Title
ISSN
Subject
Publisher
Country of publisher
Search
BIO Web of Conferences
(Jan 2024)
Electron channeling pattern imaging – a novel approach for the determination of wafer offcut angles
Han Han,
Strakos Libor,
Porret Clément,
Depauw Valérie,
Vystavel Tomas,
Richard Olivier,
Grieten Eva,
Hantschel Thomas
Affiliations
Han Han
imec
Strakos Libor
Thermo Fischer Scientific
Porret Clément
imec
Depauw Valérie
imec
Vystavel Tomas
Thermo Fischer Scientific
Richard Olivier
imec
Grieten Eva
imec
Hantschel Thomas
imec
DOI
https://doi.org/10.1051/bioconf/202412907022
Journal volume & issue
Vol. 129
p. 07022
Abstract
Read online
No abstracts available.
Keywords
wafer offcut
misorientation
ecpi
WeChat QR code
Close