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Open Physics
(Apr 2011)
Mapping of mechanical properties of the surface by utilization of torsional oscillation of the cantilever in atomic force microscopy
Sikora Andrzej,
Bednarz Lukasz
Affiliations
Sikora Andrzej
Electrotechnical Institute Division of Electrotechnology and Materials Science, ul. M. Skłodowskiej-Curie 55/61, 50-369, Wrocław, Poland
Bednarz Lukasz
Electrotechnical Institute Division of Electrotechnology and Materials Science, ul. M. Skłodowskiej-Curie 55/61, 50-369, Wrocław, Poland
DOI
https://doi.org/10.2478/s11534-010-0127-4
Journal volume & issue
Vol. 9, no. 2
pp. 372 – 379
Abstract
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No abstracts available.
Keywords
atomic force microscopy
mechanical properties mapping
signal processing
torsional oscillations
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