Key Technology Practice of High-Speed Access and Research on the Temperature Dependence of Key Time Parameters Based on NAND Flash Memory

Abstract

This paper focuses on the NAND flash memory as a data storage medium in the Internet of things data acquisition system, which plays an important role from beginning to end. The flow process of multi-channel sensor data sampling, holding, conversion, coding, and storage in the data acquisition system is described. The basic working principle and working process of NAND flash memory are introduced. Based on Interleaved Two-plane Program Technology, and the solution of burst massive throughput in high-speed data transmission is proposed. Compared with previously published papers, the temperature dependence of key time parameters of NAND flash memory is studied and analyzed under the condition of temperature change more concretely. The changing trend of three key time parameters of NAND type flash under different temperatures is analyzed by using appropriate test samples. At the same time, the analysis of the causes of reflection from the phenomenon is further expanded and discussed. The combination of theory and practice can provide powerful suggestions for more efficient and accurate application of NAND flash memory.

Keywords

• NAND flash
• interleave two-plane program
• burst massive data
• temperature dependence