The Directory of Open Access Journals
DOAJ Logotype
Open
Global
Trusted
Main actions
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Search
Menu
Secondary actions
Search
Journals
Articles
Documentation
API
OAI-PMH
Widgets
Public data dump
OpenURL
XML
Metadata help
Preservation
About
About DOAJ
DOAJ at 20
DOAJ team
Ambassadors
Advisory Board & Council
Volunteers
News
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Login
Login
Quick search
Close
×
Journals
Articles
Search by keywords:
In the field:
In all fields
Title
ISSN
Subject
Publisher
Country of publisher
Search
ACS Omega
(May 2017)
Electrical Stabilization of Surface Resistivity in Epitaxial Graphene Systems by Amorphous Boron Nitride Encapsulation
Albert F. Rigosi,
Chieh-I Liu,
Nicholas R. Glavin,
Yanfei Yang,
Heather M. Hill,
Jiuning Hu,
Angela R. Hight Walker,
Curt A. Richter,
Randolph E. Elmquist,
David B. Newell
Affiliations
Albert F. Rigosi
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
Chieh-I Liu
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
Nicholas R. Glavin
Materials and Manufacturing Directorate, Air Force Research Laboratory, Dayton, Ohio, United States
Yanfei Yang
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
Heather M. Hill
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
Jiuning Hu
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
Angela R. Hight Walker
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
Curt A. Richter
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
Randolph E. Elmquist
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
David B. Newell
Physical Measurement Laboratory (PML), National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, United States
DOI
https://doi.org/10.1021/acsomega.7b00341
Journal volume & issue
Vol. 2, no. 5
pp. 2326 – 2332
Abstract
Read online
No abstracts available.
WeChat QR code
Close