CHIMIA (Dec 1992)
TXRF Spektrometer zum Nachweis von Spurenelementen
Abstract
The TXRF (total reflection X-ray fluorescence) spectrometer is a very useful instrument for measuring ultratrace elements in aqueous solutions, in metals, in minerals, in biological and environmental samples etc. Elements with atomic number >13 are detected simultaneously with a minimum detection limit of pg. The sample preparation is very simple and only few ?g or ?l sample material is required.