CHIMIA (Dec 1992)

TXRF Spektrometer zum Nachweis von Spurenelementen

  • Ferenc Hegedüs

Journal volume & issue
Vol. 46, no. 12

Abstract

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The TXRF (total reflection X-ray fluorescence) spectrometer is a very useful instrument for measuring ultratrace elements in aqueous solutions, in metals, in minerals, in biological and environmental samples etc. Elements with atomic number >13 are detected simultaneously with a minimum detection limit of pg. The sample preparation is very simple and only few ?g or ?l sample material is required.